Vol. 102

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2020-05-21

Applications of the Random Coupling Model to Assess Induced Currents OR Voltages in Reverberant Environment

By Valentin Houchouas, Muriel Darces, Marc Hélier, Emmanuel Cottais, and José Lopes Esteves
Progress In Electromagnetics Research C, Vol. 102, 109-125, 2020
doi:10.2528/PIERC20022707

Abstract

Coupling in electronic devices may be a threat for the security of the information they process. Indeed, a current flowing into a conductor may radiate an electromagnetic field that will couple onto other conductors creating parasitic signals. If this current conveys sensitive information, its confidentiality may not be guaranteed. Moreover, depending on the amplitude of these parasitic signals, dysfunction may occur. It is thus valuable to assess the coupling effects in order to evaluate the probability that a current or a voltage reaches a given magnitude. This relevant quantity may be an input for a risk analysis process. In this study, we will focus on the study of couplings in reverberant cavities, and especially into the chassis of desktop computers. We will highlight that the Random Coupling Model (RCM) may be applied to determine statistical quantities related to induced currents or voltages between several ports placed inside a reverberant environment. Comparisons with experimental data, for several system configurations, show that the application of this model is relevant and allows to rapidly obtain the percentiles of the induced currents. At first, the coupling between two monopoles is studied, and then the coupling between printed circuit boards that are stacked together is investigated. Finally, the effect of adding broadband absorbers in casings is assessed.

Citation


Valentin Houchouas, Muriel Darces, Marc Hélier, Emmanuel Cottais, and José Lopes Esteves, "Applications of the Random Coupling Model to Assess Induced Currents OR Voltages in Reverberant Environment," Progress In Electromagnetics Research C, Vol. 102, 109-125, 2020.
doi:10.2528/PIERC20022707
http://test.jpier.org/PIERC/pier.php?paper=20022707

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