In a previous paper, we have introduced an innovative approach called the self-adaptive correlation method (SACM). It consists in treating the reflectogram in order to amplify the signatures of soft defects and make them more easily detectable. This method allows to highlight the soft defect while attenuating the noise present on the reflectogram and has the advantage of reducing the computational complexity compared to the state of the art. We drew attention to the sensitivity of the performance of this method to noise. In this paper, we propose a solution for the pre-denoising of reflectogram before applying the SACM. This solution consists of an adapted version of the empirical mode decomposition algorithm, we called MEMD for Modified Empirical Mode Decomposition which bypasses some limitations of the conventional EMD.
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